The SN-VR-P05 is engineered for high-precision inspection of IC wire pads, wafers, and related semiconductor components. Integrated with a 3D laser detection system, it ensures accurate analysis of tiny defects such as cracks, scratches, and poor ball implantation — reducing human error while improving speed and consistency.
With advanced AI-powered optical tools and deep learning capabilities, the machine adapts to complex testing needs and various product types. It also supports full system integration, including MAP, MES, and SECS/GEM, making it a smart and scalable solution for modern wafer inspection lines.
| Item | Details |
|---|---|
| Input Power | AC100–240V ±15%, 50Hz–60Hz, 20Amp |
| CDA | 0.4–0.6 Mpa, 100 L/min |
| Size (L×W×H) | 1500mm × 1100mm × 2000mm |
| Weight | About 500 kg |
| Inspection Criteria | Cracks, scratches, chip defects, foreign objects, poor ball implantation, etc. |
| Compatibility | AI-powered optical inspection with deep learning. Customizable by evaluation. |
| Function | Supports MAP, MES, SECS/GEM integration |
| Accuracy | Up to micrometer-level precision, based on detection requirements |
| Speed | 65,000 pieces per 4 hours (based on 8-inch wafer products) |
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At Provision Tech, we specialize in importing high-quality products from Seeney, ensuring the best value for our customers. Our mission is to provide reliable, innovative solutions that help businesses succeed.
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5, Lorong Nagasari 2, Taman Nagasari, 13600 Prai, Penang,Malaysia.
